| Oceanography > Issues > Archive > Volume 11 > Issue 1 |
1998, Oceanography 11(1):48–50, http://dx.doi.org/10.5670/oceanog.1998.15
Effects of a Thin Layer of Reflectance and Remote-Sensing Reflectance
Authors | First Paragraph | Full Article | Citation
Authors
A.A. Petrenko | Washington State Department of Ecology, Olympia, WA, USA; currently at Centre d'Oceanologie de Marseille, Campus de Luminy, Marseille-Cedex 09, France
J.R.V. Zaneveld | College of Oceanic and Atmospheric Sciences, Oregon State University, Corvallis, OR, USA
W.S. Pegau | College of Oceanic and Atmospheric Sciences, Oregon State University, Corvallis, OR, USA
A.H. Barnard | College of Oceanic and Atmospheric Sciences, Oregon State University, Corvallis, OR, USA
C.D. Mobley | Sequoia Scientific, Mercer Island, WA, USA
First Paragraph
Optical remote sensing using satellites holds the promise of determining biological and optical properties globally. Much research has been carried out on the inversion of the spectral radiance signals detected by satellite. However, almost all inversion algorithms are based on the assumption of a homogeneous ocean. How do thin layers of particulate matter affect the reflectance of the ocean? A thin layer exhibits increases in absorption and scattering parameters (inherent optical properties, IOPs) (Preisendorfer, 1961) compared with surrounding waters. These increases are due primarily to phytoplankton and in a lesser degree to dissolved organic matter.
Full Article
Citation
Petrenko, A.A., J.R.V. Zaneveld, W.S. Pegau, A.H. Barnard, and C.D. Mobley. 1998. Effects of a thin layer of reflectance and remote-sensing reflectance. Oceanography 11(1):48–50, http://dx.doi.org/10.5670/oceanog.1998.15.